"Unclamped repetitive stress on 1200 V normally-off SiC JFETs."

Carmine Abbate, Giovanni Busatto, Francesco Iannuzzo (2012)

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DOI: 10.1016/J.MICROREL.2012.06.097

access: closed

type: Journal Article

metadata version: 2020-02-22

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Carmine Abbate, Giovanni Busatto, Francesco Iannuzzo:
Unclamped repetitive stress on 1200 V normally-off SiC JFETs. Microelectron. Reliab. 52(9-10): 2420-2425 (2012)

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