"An investigation of how circuit parameters affect the short-circuit type 2 ..."

Jingping Zhang et al. (2025)

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DOI: 10.1016/J.MEJO.2025.106665

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type: Journal Article

metadata version: 2025-05-01

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Jingping Zhang, Houcai Luo, Huan Wu, Bofeng Zheng, Xianping Chen:
An investigation of how circuit parameters affect the short-circuit type 2 ruggedness in FS-IGBT. Microelectron. J. 159: 106665 (2025)

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