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"Two effective methods to detect anomalies in embedded systems."

Mahroo Zandrahimi, Hamid R. Zarandi, Mohammad Hadi Mottaghi (2012)

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DOI: 10.1016/J.MEJO.2011.11.003

access: closed

type: Journal Article

metadata version: 2022-09-13

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Mahroo Zandrahimi, Hamid R. Zarandi, Mohammad Hadi Mottaghi:
Two effective methods to detect anomalies in embedded systems. Microelectron. J. 43(1): 77-87 (2012)

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