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"Systematic characterization for RF small-signal parameter extraction of 28 ..."

Xuejing Yang et al. (2023)

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DOI: 10.1016/J.MEJO.2023.105862

access: closed

type: Journal Article

metadata version: 2023-07-21

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Xuejing Yang, Seungkyeong Lee, Songcheol Hong, Kyounghoon Yang:
Systematic characterization for RF small-signal parameter extraction of 28 nm FDSOI MOSFETs up to 110 GHz. Microelectron. J. 138: 105862 (2023)

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