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"Simulation study of lateral CEFT logic performance at 3 nm Node."

Guanguo Wen et al. (2023)

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DOI: 10.1016/J.MEJO.2023.105865

access: closed

type: Journal Article

metadata version: 2023-09-24

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  - journals/mj/WenLSWLHZ23
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  - https://dblp.org/rec/journals/mj/WenLSWLHZ23
Guanguo Wen, Qiang Long, Xinlong Shi, Ying Wang, Feng Liu, Huiyong Hu, Jincheng Zhang:
Simulation study of lateral CEFT logic performance at 3 nm Node. Microelectron. J. 139: 105865 (2023)

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