"Micro-structure damage analysis of GaN HEMTs based on voltage transient ..."

Qian Wen et al. (2025)

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DOI: 10.1016/J.MEJO.2025.106784

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type: Journal Article

metadata version: 2025-08-09

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Qian Wen, Chunsheng Guo, Yingchen Du, Xianwei Meng, Shiwei Feng, Yamin Zhang:
Micro-structure damage analysis of GaN HEMTs based on voltage transient trap characterization. Microelectron. J. 164: 106784 (2025)

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