"A prognostic method for the embedded failure monitoring of solder ..."

Juha-Veikko Voutilainen et al. (2009)

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DOI: 10.1016/J.MEJO.2007.09.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Juha-Veikko Voutilainen, Jussi Putaala, Markku Moilanen, Heli Jantunen:
A prognostic method for the embedded failure monitoring of solder interconnections with 1149.4 test bus architecture. Microelectron. J. 40(7): 1069-1080 (2009)

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