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"Reliability physics study for semiconductor-polymer device development."

Dyanna G. D. Teixeira et al. (2003)

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DOI: 10.1016/S0026-2692(03)00109-5

access: closed

type: Journal Article

metadata version: 2020-09-21

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  - journals/mj/TeixeiraLVSAK03
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  - https://dblp.org/rec/journals/mj/TeixeiraLVSAK03
Dyanna G. D. Teixeira, Jane M. G. Laranjeira, Elder A. de Vasconcelos, Eronides Felisberto da Silva Júnior, Walter M. de Azevedo, Helen J. Khoury:
Reliability physics study for semiconductor-polymer device development. Microelectron. J. 34(5-8): 713-715 (2003)

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