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"Testability-analysis driven test-generation of analogue cores."

M. Stancic, Hans G. Kerkhoff (2003)

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DOI: 10.1016/S0026-2692(03)00159-9

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mj/StancicK03
M. Stancic, Hans G. Kerkhoff:
Testability-analysis driven test-generation of analogue cores. Microelectron. J. 34(10): 913-917 (2003)

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