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"Measuring resistivity of silicon nanowire using pseudo-random binary ..."
Tomi Roinila et al. (2014)
- Tomi Roinila
, Hongjiang Zeng, Jarmo Verho, Yu Xiao, Matti Vilkko
, Pasi Kallio
, Jukka Lekkala
, Tie Li, Yuelin Wang:
Measuring resistivity of silicon nanowire using pseudo-random binary sequence injection. Microelectron. J. 45(7): 976-980 (2014)
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