"Unveiling the influence of temperature and interface traps on the ..."

Potharaju Ramesh, Bijit Choudhuri (2024)

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DOI: 10.1016/J.MEJO.2024.106201

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type: Journal Article

metadata version: 2024-05-31

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Potharaju Ramesh, Bijit Choudhuri:
Unveiling the influence of temperature and interface traps on the performance of source-all-around vertical TFET. Microelectron. J. 148: 106201 (2024)

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