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"Behavioral test generation modeling approach for mixed-signal IC verification."

Veikko Loukusa (2003)

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DOI: 10.1016/S0026-2692(03)00164-2

access: closed

type: Journal Article

metadata version: 2020-02-22

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Veikko Loukusa:
Behavioral test generation modeling approach for mixed-signal IC verification. Microelectron. J. 34(10): 907-912 (2003)

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