"Dynamic self-test scheme and authentication protocol for improving ..."

Yan Li et al. (2023)

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DOI: 10.1016/J.MEJO.2023.105864

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type: Journal Article

metadata version: 2023-09-24

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Yan Li, Weifeng Yang, Jiang Li, Yanfang Yuan, Hu Zhang, Fengdi Wang, Yijun Cui:
Dynamic self-test scheme and authentication protocol for improving robustness of strong PUF. Microelectron. J. 139: 105864 (2023)

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