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"Measurement method of the IGBT chip temperature fluctuation based on ..."

Lie Li, Yigang He, Bolun Du (2022)

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DOI: 10.1016/J.MEJO.2022.105613

access: closed

type: Journal Article

metadata version: 2023-01-15

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Lie Li, Yigang He, Bolun Du:
Measurement method of the IGBT chip temperature fluctuation based on electrothermal model derivation. Microelectron. J. 130: 105613 (2022)

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