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"Double cell upsets mitigation through triple modular redundancy."

Yuanqing Li et al. (2020)

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DOI: 10.1016/J.MEJO.2019.104683

access: closed

type: Journal Article

metadata version: 2024-02-05

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Yuanqing Li, Anselm Breitenreiter, Marko S. Andjelkovic, Junchao Chen, Milan Babic, Milos Krstic:
Double cell upsets mitigation through triple modular redundancy. Microelectron. J. 96: 104683 (2020)

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