"Transient thermo-reflectance measurements of the thermal conductivity and ..."

Pavel L. Komarov et al. (2003)

> Home

Details and statistics

DOI: 10.1016/S0026-2692(03)00201-5

access: closed

type: Journal Article

metadata version: 2020-10-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mj/KomarovBKR03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/KomarovBKR03
Pavel L. Komarov, Mihai G. Burzo, Gunhan Kaytaz, Peter E. Raad:
Transient thermo-reflectance measurements of the thermal conductivity and interface resistance of metallized natural and isotopically-pure silicon. Microelectron. J. 34(12): 1115-1118 (2003)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.