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"Conditions of temperature and time instability occurrence of ..."
B. Kojecký, Václav Papez, D. Sámal (2006)
- B. Kojecký, Václav Papez, D. Sámal:
Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices. Microelectron. J. 37(3): 269-274 (2006)
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