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"Conditions of temperature and time instability occurrence of ..."

B. Kojecký, Václav Papez, D. Sámal (2006)

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DOI: 10.1016/J.MEJO.2005.09.030

access: closed

type: Journal Article

metadata version: 2020-07-02

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B. Kojecký, Václav Papez, D. Sámal:
Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices. Microelectron. J. 37(3): 269-274 (2006)

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