"Analog and mixed signal test techniques for SoCs."

Hans G. Kerkhoff, Bozena Kaminska (2003)

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DOI: 10.1016/S0026-2692(03)00234-9

access: closed

type: Journal Article

metadata version: 2020-02-22

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Hans G. Kerkhoff, Bozena Kaminska:
Analog and mixed signal test techniques for SoCs. Microelectron. J. 34(10): 887-888 (2003)

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