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"Replica Bit-Line Technique for Internal Refresh in Logic-Compatible ..."

Odem Harel, Yarden Nachum, Robert Giterman (2020)

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DOI: 10.1016/J.MEJO.2020.104781

access: closed

type: Journal Article

metadata version: 2020-07-10

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Odem Harel, Yarden Nachum, Robert Giterman:
Replica Bit-Line Technique for Internal Refresh in Logic-Compatible Gain-Cell Embedded DRAM. Microelectron. J. 101: 104781 (2020)

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