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"Simulation and comparison of two sequential logic-in-memory approaches ..."
S. Ferch et al. (2014)
- S. Ferch, Eike Linn, Rainer Waser
, Stephan Menzel
:
Simulation and comparison of two sequential logic-in-memory approaches using a dynamic electrochemical metallization cell model. Microelectron. J. 45(11): 1416-1428 (2014)
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