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"Impact of pulse quenching effect on soft error vulnerabilities in ..."

Yankang Du, Shuming Chen, Biwei Liu (2013)

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DOI: 10.1016/J.MEJO.2012.11.011

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yankang Du, Shuming Chen, Biwei Liu:
Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on standard cells. Microelectron. J. 44(2): 65-71 (2013)

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