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"Bit-line leakage current tracking and self-compensation circuit for SRAM ..."

Chenghu Dai et al. (2023)

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DOI: 10.1016/J.MEJO.2023.105699

access: closed

type: Journal Article

metadata version: 2023-03-25

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Chenghu Dai, Yuanyuan Du, Qi Shi, Ruixuan Wang, Hao Zheng, Wenjuan Lu, Chunyu Peng, Licai Hao, Zhiting Lin, Xiulong Wu:
Bit-line leakage current tracking and self-compensation circuit for SRAM reliability design. Microelectron. J. 132: 105699 (2023)

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