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"Leakage current effects on N-MOSFETs after thermal ageing in pulsed life ..."
Mohamed Ali Belaïd et al. (2014)
- Mohamed Ali Belaïd, Ahmed M. Nahhas, M. Gares, K. Daoud, Olivier Latry:
Leakage current effects on N-MOSFETs after thermal ageing in pulsed life tests. Microelectron. J. 45(12): 1800-1805 (2014)
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