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"Using Bulk Built-in Current Sensors to Detect Soft Errors."

Egas Henes Neto et al. (2006)

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DOI: 10.1109/MM.2006.103

access: closed

type: Journal Article

metadata version: 2021-10-14

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  persistent URL:
  - https://dblp.org/rec/journals/micro/NetoRVWK06
Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt:
Using Bulk Built-in Current Sensors to Detect Soft Errors. IEEE Micro 26(5): 10-18 (2006)

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