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"Automating Stressmark Generation for Testing Processor Voltage Fluctuations."
Youngtaek Kim et al. (2013)
- Youngtaek Kim, Lizy Kurian John, Sanjay Pant, Srilatha Manne, Michael J. Schulte, William Lloyd Bircher, Madhu Saravana Sibi Govindan:
Automating Stressmark Generation for Testing Processor Voltage Fluctuations. IEEE Micro 33(4): 66-75 (2013)
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