"Neural networks-based scheme for system failure detection and diagnosis."

Y. M. Chen, M. L. Lee (2002)

Details and statistics

DOI: 10.1016/S0378-4754(01)00330-5

access: closed

type: Journal Article

metadata version: 2020-03-04

a service of  Schloss Dagstuhl - Leibniz Center for Informatics