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"Testing methodology: implications for the circuit designer."

Brian R. Wilkins (1988)

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DOI: 10.1016/0141-9331(88)90006-3

access: closed

type: Journal Article

metadata version: 2020-02-22

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Brian R. Wilkins:
Testing methodology: implications for the circuit designer. Microprocess. Microsystems 12(10): 573-584 (1988)

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