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"An Architectural-Level Reliability Improvement Scheme in STT-MRAM Main Memory."

Nooshin Mahdavi, Farhad Razaghian, Hamed Farbeh (2022)

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DOI: 10.1016/J.MICPRO.2022.104462

access: closed

type: Journal Article

metadata version: 2023-09-08

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  - https://dblp.org/rec/journals/mam/MahdaviRF22
Nooshin Mahdavi, Farhad Razaghian, Hamed Farbeh:
An Architectural-Level Reliability Improvement Scheme in STT-MRAM Main Memory. Microprocess. Microsystems 90: 104462 (2022)

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