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"A structured approach to board-level BIST using the boundary-scan master."
Najmi T. Jarwala, Chi W. Yau (1993)
- Najmi T. Jarwala, Chi W. Yau:
A structured approach to board-level BIST using the boundary-scan master. Microprocess. Microsystems 17(5): 289-297 (1993)
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