"A low-cost tester for boundary scan."

Ad J. van de Goor, J. A. M. van Tetering (1991)

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DOI: 10.1016/0141-9331(91)90088-W

access: closed

type: Journal Article

metadata version: 2021-05-25

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Ad J. van de Goor, J. A. M. van Tetering:
A low-cost tester for boundary scan. Microprocess. Microsystems 15(2): 82-90 (1991)

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