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"Expert system to configure global design for testability structure in a ..."
Sudipta Bhawmik, Parimal Pal Chaudhuri (1989)
- Sudipta Bhawmik, Parimal Pal Chaudhuri:
Expert system to configure global design for testability structure in a VLSI circuit. Microprocess. Microsystems 13(7): 462-472 (1989)
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