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"A fully automatic adjacent key-points localization framework for minimal ..."

Qiyan Zang et al. (2024)

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DOI: 10.1016/J.KNOSYS.2024.112157

access: closed

type: Journal Article

metadata version: 2024-07-11

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Qiyan Zang, Jian Zhang, Liling Bo, Yuchen Xiao, Guangwei Gao, Heng Zhang, Hongran Li, Zhaoman Zhong, Yan Ren:
A fully automatic adjacent key-points localization framework for minimal repeated pattern detection in printed fabric images. Knowl. Based Syst. 300: 112157 (2024)

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