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"Advanced uncertainty based approach for discovering erasable product patterns."

Chanhee Lee et al. (2022)

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DOI: 10.1016/J.KNOSYS.2022.108134

access: closed

type: Journal Article

metadata version: 2022-03-15

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Chanhee Lee, Yoonji Baek, Jerry Chun-Wei Lin, Tin C. Truong, Unil Yun:
Advanced uncertainty based approach for discovering erasable product patterns. Knowl. Based Syst. 241: 108134 (2022)

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