Stop the war!
Остановите войну!
for scientists:
default search action
"Characterization of Dynamic SRAM Stability in 45 nm CMOS."
Seng Oon Toh et al. (2011)
- Seng Oon Toh, Zheng Guo, Tsu-Jae King Liu, Borivoje Nikolic:
Characterization of Dynamic SRAM Stability in 45 nm CMOS. IEEE J. Solid State Circuits 46(11): 2702-2712 (2011)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.