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ORCID"On-Chip Combined C-V/I-V Characterization System in 45-nm CMOS Technology."
Simeon Realov, Kenneth L. Shepard (2013)
- Simeon Realov, Kenneth L. Shepard:
On-Chip Combined C-V/I-V Characterization System in 45-nm CMOS Technology. IEEE J. Solid State Circuits 48(3): 814-826 (2013)
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