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"Parametric yield prediction of complex, mixed-signal IC's."

Martin O'Leary, Colin Lyden (1995)

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DOI: 10.1109/4.364442

access: closed

type: Journal Article

metadata version: 2023-05-03

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  - journals/jssc/OLearyL95
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  - https://dblp.org/rec/journals/jssc/OLearyL95
Martin O'Leary, Colin Lyden:
Parametric yield prediction of complex, mixed-signal IC's. IEEE J. Solid State Circuits 30(3): 279-285 (1995)

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