"A test circuit for measurement of clocked storage element characteristics."

Nikola Nedovic, William W. Walker, Vojin G. Oklobdzija (2004)

Details and statistics

DOI: 10.1109/JSSC.2004.831498

access: closed

type: Journal Article

metadata version: 2022-04-22

a service of  Schloss Dagstuhl - Leibniz Center for Informatics