"Modeling and simulation of hot-carrier-induced device degradation in MOS ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Yusuf Leblebici, Sung-Mo Kang (1993)

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DOI: 10.1109/4.229396

access: closed

type: Journal Article

metadata version: 2025-02-06

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Yusuf Leblebici, Sung-Mo Kang:
Modeling and simulation of hot-carrier-induced device degradation in MOS circuits. IEEE J. Solid State Circuits 28(5): 585-595 (1993)

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