Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Design of charge pump circuit with consideration of gate-oxide reliability ..."

Ming-Dou Ker, Shih-Lun Chen, Chia-Sheng Tsai (2006)

> Home

Details and statistics

DOI: 10.1109/JSSC.2006.872704

access: closed

type: Journal Article

metadata version: 2021-10-15

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jssc/KerCT06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/KerCT06
Ming-Dou Ker, Shih-Lun Chen, Chia-Sheng Tsai:
Design of charge pump circuit with consideration of gate-oxide reliability in low-voltage CMOS processes. IEEE J. Solid State Circuits 41(5): 1100-1107 (2006)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.