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"High reliability electron-ejection method for high density flash memories."
Takayuki Kawahara et al. (1995)
- Takayuki Kawahara, Naoki Miyamoto, Syun-ichi Saeki, Yusuke Jyouno, Masataka Kato, Katsutaka Kimura:
High reliability electron-ejection method for high density flash memories. IEEE J. Solid State Circuits 30(12): 1554-1562 (1995)
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