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"The Invariance of Characteristic Current Densities in Nanoscale MOSFETs ..."

Timothy O. Dickson et al. (2006)

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DOI: 10.1109/JSSC.2006.875301

access: closed

type: Journal Article

metadata version: 2021-10-15

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  - journals/jssc/DicksonYCMLBWTY06
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  - https://dblp.org/rec/journals/jssc/DicksonYCMLBWTY06
Timothy O. Dickson, Kenneth H. K. Yau, Theodoros Chalvatzis, Alain M. Mangan, Ekaterina Laskin, Rudy Beerkens, Paul Westergaard, Mihai Tazlauanu, Ming-Ta Yang, Sorin P. Voinigescu:
The Invariance of Characteristic Current Densities in Nanoscale MOSFETs and Its Impact on Algorithmic Design Methodologies and Design Porting of Si(Ge) (Bi)CMOS High-Speed Building Blocks. IEEE J. Solid State Circuits 41(8): 1830-1845 (2006)

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