"Compact Measurement Schemes for Bit-Line Swing, Sense Amplifier Offset ..."

Yen-Huei Chen et al. (2012)

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DOI: 10.1109/JSSC.2012.2185180

access: closed

type: Journal Article

metadata version: 2024-02-05

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Yen-Huei Chen, Shao-Yu Chou, Quincy Li, Wei-Min Chan, Dar Sun, Hung-Jen Liao, Ping Wang, Meng-Fan Chang, Hiroyuki Yamauchi:
Compact Measurement Schemes for Bit-Line Swing, Sense Amplifier Offset Voltage, and Word-Line Pulse Width to Characterize Sensing Tolerance Margin in a 40 nm Fully Functional Embedded SRAM. IEEE J. Solid State Circuits 47(4): 969-980 (2012)

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