"A 45 nm Resilient Microprocessor Core for Dynamic Variation Tolerance."

Keith A. Bowman et al. (2011)

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DOI: 10.1109/JSSC.2010.2089657

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type: Journal Article

metadata version: 2024-10-06

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Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Paolo A. Aseron, Muhammad M. Khellah, Arijit Raychowdhury, Bibiche M. Geuskens, Carlos Tokunaga, Chris Wilkerson, Tanay Karnik, Vivek K. De:
A 45 nm Resilient Microprocessor Core for Dynamic Variation Tolerance. IEEE J. Solid State Circuits 46(1): 194-208 (2011)

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