"A feature matching and transfer approach for cross-company defect prediction."

Qiao Yu, Shujuan Jiang, Yanmei Zhang (2017)

Details and statistics

DOI: 10.1016/J.JSS.2017.06.070

access: closed

type: Journal Article

metadata version: 2020-02-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics