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"An empirical comparison and characterization of high defect and high ..."

Akif Günes Koru, Jeff Tian (2003)

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DOI: 10.1016/S0164-1212(02)00126-7

access: closed

type: Journal Article

metadata version: 2020-02-24

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Akif Günes Koru, Jeff Tian:
An empirical comparison and characterization of high defect and high complexity modules. J. Syst. Softw. 67(3): 153-163 (2003)

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