"Identification analysis of defect topologies by self-attention based ..."

Kazuki Yamamoto et al. (2024)

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DOI: 10.14495/JSIAML.16.17

access: open

type: Journal Article

metadata version: 2025-04-27

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Kazuki Yamamoto, Takahiko Kurahashi, Yuki Murakami, Fujio Ikeda, Ikuo Ihara:
Identification analysis of defect topologies by self-attention based machine learning (Effect of the number of training data on identification accuracy). JSIAM Lett. 16: 17-20 (2024)

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