"On the pass rate of NIST statistical test suite for randomness."

Akihiro Yamaguchi, Takaaki Seo, Keisuke Yoshikawa (2010)

Details and statistics

DOI: 10.14495/JSIAML.2.123

access: open

type: Journal Article

metadata version: 2021-02-17

a service of  Schloss Dagstuhl - Leibniz Center for Informatics