"High-reliability topological architectures for networks under stress."

Guy E. Weichenberg, Vincent W. S. Chan, Muriel Médard (2004)

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DOI: 10.1109/JSAC.2004.835750

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type: Journal Article

metadata version: 2022-10-17

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Guy E. Weichenberg, Vincent W. S. Chan, Muriel Médard:
High-reliability topological architectures for networks under stress. IEEE J. Sel. Areas Commun. 22(9): 1830-1845 (2004)

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