"Integrated analysis of reliability, power, and performance for IoT devices ..."

Keqin Li (2024)

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DOI: 10.1016/J.SYSARC.2024.103216

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type: Journal Article

metadata version: 2024-07-19

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Keqin Li:
Integrated analysis of reliability, power, and performance for IoT devices and servers. J. Syst. Archit. 154: 103216 (2024)

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