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"An approach to testability analysis and improvement for VLSI systems."

Xinli Gu, Krzysztof Kuchcinski, Zebo Peng (1992)

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DOI: 10.1016/0165-6074(92)90358-E

access: closed

type: Journal Article

metadata version: 2020-05-19

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  - journals/jsa/GuKP92
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  - https://dblp.org/rec/journals/jsa/GuKP92
Xinli Gu, Krzysztof Kuchcinski, Zebo Peng:
An approach to testability analysis and improvement for VLSI systems. Microprocess. Microprogramming 35(1-5): 485-492 (1992)

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